Double Feature:
Dr. Ted Limpoco of Asylum Research, an Oxford Instruments Company discussed the basics of SMIM, an atomic force microscopy-based technique, and the types of information that can be attained using the technique. This technique can be used to probe the impedance of the tip-sample interface and learn about the local electrical properties.
Dr. Kirill D. Shcherbachev of the Russian National University of Science and Technology discussed advanced HR-XRD techniques for characterizing ion-damaged single crystals. The techniques discussed may be used to attain a damage depth distribution using the shape of the diffraction curve, separating coherently and incoherently scattered x-rays.
Dr. Ted Limpoco of Asylum Research, an Oxford Instruments Company discussed the basics of SMIM, an atomic force microscopy-based technique, and the types of information that can be attained using the technique. This technique can be used to probe the impedance of the tip-sample interface and learn about the local electrical properties.
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