Profs. Krogstad and Huang of UIUC

AVS hosted a double feature:
Prof. Krogstad (Asst. Professor, Department of Materials Science and Engineering) discussed how a fundamental understanding of local microstructural evolution, thermodynamic and kinetic driving forces, and mechanical response can be used to improve the long-term response of materials under extreme conditions.

Prof. Huang (Asst. Professor, Department of Materials Science and Engineering) then discussed her TEM investigations into 2-d material interfaces with single-atom precision. She focused on methods for investigating the atomic structure around these interfaces and tied these defects to electronic structure and properties.

Joint AVS-MRS Argonne National Laboratory Trip

AVS and MRS went together to visit the beam lines at Argonne National Laboratory.

AVS and Asylum Research, an Oxford Instruments Company seminar on Scanning Microwave Impedance Microscopy and XRD characterization of ion-damaged single crystals

Double Feature:

Dr. Ted Limpoco of Asylum Research, an Oxford Instruments Company discussed the basics of SMIM, an atomic force microscopy-based technique, and the types of information that can be attained using the technique. This technique can be used to probe the impedance of the tip-sample interface and learn about the local electrical properties.

Dr. Kirill D. Shcherbachev of the Russian National University of Science and Technology discussed advanced HR-XRD techniques for characterizing ion-damaged single crystals. The techniques discussed may be used to attain a damage depth distribution using the shape of the diffraction curve, separating coherently and incoherently scattered x-rays.

Engineering Open House 2015

Unfortunately, the camera broke, so here is a picture from a prior year, but we did more vacuum demonstrations for kids at the 2015 Engineering Open House on Mar. 13. Thank you to all who were able to help out!